1995-1999 : J.L. Lábár's publications

Referenced Journals:

  1. J.L. Lábár: "Electron probe X-ray analysis of stratifiedbulk samples", Archives of Metallurgy 40 (1995) 85-102
  2. J.L. Lábár: "Electron probe X-ray analysis of light elements", Archives of Metallurgy 40 (1995) 103-120
  3. J.L. Lábár: "Standardless analysis of non-biological samples", Microbeam Analysis 4 (1995) 65-83
  4. J. Osán, Sz. Török, K. Török, L. Németh,L.J. Lábár: "Physiological effects of fly ash treatment oncloned plants and EPMA single particle analysis of the deposited dust", X-Ray Spectrometry 25 (1996) 167-172
  5. Radi Zs, Barna PB, Lábár J,: "Kirkendall coids and the formationof amorphous phase in the Al-Pt thin-film system prepared by high-temperature successive deposition", J. Appl. Phys. 79 (1996) 4096-4100
  6. Török Sz, Van Grieken R, Lábár JL: "X-Ray Spectromerty", Analytical Chemistry 68 (1996) 467R-485R
  7. Lábár JL, Adamik M, Dódony I: "Contamination in analyticalelectron microscopy and in ALCHEMI", Mikrochimika Acta, Suppl. 15 (1998)65-71
  8. Török Sz, Lábár JL, Schmelling M and Van GriekenR: "X-Ray Spectrometry", Analytical Chemistry 70 (1998) 495R-517R
  9. Dávid L, Kovács B, Mojzes I, Pécz B and LábárJL: "Electrical and microstructure analysis of Ni/Ge/n-GaAs interface", ThinSolid Films, 323 (1998) 212-216
  10. Dávid L, Kovács B, Mojzes I, Pécz B and LábárJL and Dobos L: "Electrical and structural characterisation of Ni/Ge/n-GaAsinterface", Vacuum 50 (1998), 395-398
  11. Lábár JL and Morgiel J: "A new method form measurement of thickness in single crystals", Micron 29 (1998) 425-430
  12. Radi Zs, Lábár JL and Barna PB: "Diffusion coefficient of Al in metastable, amorphous Al-Pt phase", Applied Physics Letters 73 (1998)3220-3222 (full paper in PDF format )
  13. Dévényi A, Manaila R, Belu-Marian A, Macovei D, Manciu M,Popescu EM, Tanase M, Mihai ND, Barna PB, Lábár JL, SáfránGy and Braun T: "Nanocrystalline Gold in Au-doped Thin C60 Films", Thin Solid Films 335 (1998) 258-265
  14. Lábár JL: "Dynamic electrons scattering distinquishes dodecahedral and tetrahedral crystallographic sites in garnet structure", Appl. Phys. Lett. 75 (1999) 70-72 (full paper in PDF format )
  15. Popescu R., Macovei D., Devenyi A., Fratiloiu G.D., Manaila R., Barna B.P., Kovács. A., Lábár J.L. and Braun T.: “Metal Clusters in Metal/C60 Thin Film Nanosystems”, Materials Science Forum (1999) 321-324
  16. Lábár JL, Egerton R,: "Preface to Special Issue on Ion Beam Techniques", Micron 30 (1999) 195-196

Others:

  1. J.L. Lábár, V. Stary, K. Jurek: "Simultaneous measurementof composition and thickness of surface layers by EPMA", Proc. of MultinationalCongress on Electron Microscopy, Stara Lesna, 1995, 85
  2. Horacsek O, Menyhárd M., Lábár J.: "Observations onthe Formation of Bubble Dispersion in Doped Tungsten", High TemperatureMaterials and Processes 14 (1995) 207-213
  3. Lábár JL, Adamik M: "Sources of contamination and means ofits reduction in the analytical electron microscope", EUREM’96, CD
  4. Lábár JL: "Standardless vs. quantitative EDS: What can youexpect", Proceedings of EMAS’96, 60-73 (Invited lecture)
  5. Osán J, Török Sz., Török K and LábárJL: "Source identification of deposited dust on plant leaves by EPMA singleparticle analysis", Proceedings of EMAS’96, P-46
  6. Radi Zs, Barna PB and Lábár JL: "Formation, structure and composition of amorphous Al-Pt phase prepared by high temperature successivedeposition", Proceedings of EMAS’96, P-52
  7. Lábár JL: Az analitikai elektronmikroszkópia alapjai,KLTE jegyzet, 1996
  8. Kisdi-Koszó É, Szabó I, Zsoldos É, VértesyZ, Lábár J, Kollár P and Kuzminski M: "Dependence ofmagnetic properties on copper content in FINEMET type thin layers", ISMANAM-96,P-E-10
  9. Stary V, Olsovec P,  Lábár JL, Jurek K.: "Note on the simultaneousmeasurement of composition and thickness of surface thin films of GaxIn1-xAsyP1-yby EPMA",  ICTF, Salamanca, 1996
  10. Dávid L, Kovács B, Mojzes I, Pécz B, LábárJ, Dobos L: "Structural and electrical characterisation of Ni/Ge-nGaAs interface", Extended abstracts of JVC-7, Debrecen, 1997, 101-102
  11. Kovács I, Flory F, Tisserand S, Lábár JL, Sulyok A,Adamik M.: "Structure analysis of Ti implanted SiO2 and Ta2O3 optical coatings", Extended abstracts of JVC-7, Debrecen, 1997, 49-50
  12. Xia C, Harju E, Korhonen AS, Adamik M, Lábár JL, Barna BP: "Structure investigations of wear inhibiting layers on PVD TiN protectivecoatings", Extended abstracts of JVC-7, Debrecen, 1997, 161-162
  13. Lábár JL, Adamik M, Dódony I: "Contamination in analyticalelectron microscopy and in ALCHEMI", Abstracts of EMAS’97, Torquey, 1997,318
  14. Lábár JL, Radnóczi Gy: "Effect of input parameterson ALCHEMI simulations", Abstracts of 26th course Electron Crystallography,Erice, 1997, 366
  15. Lábár JL, Morgiel J: "A new method form measurement of thicknessin single crystals", Proc. 14th Int. Congr. on Electron Microscopy, Cancun,1998, Eds: Hector A Calderon Benavictes and Miguel José Yacamán,Insitute of Physics Publisher, Bristol and Phyladelphia, 1998, Vol. III.,761-762
  16. Lábár JL, Pécz, B and Radnóczi G: "Domains ofreversed polarity in 2H-GaN", Proc. 14th Int. Congr. on Electron Microscopy,Cancun, 1998, Eds: Hector A Calderon Benavictes and Miguel JoséYacamán, Insitute of Physics Publisher, Bristol and Phyladelphia,1998, Vol. III., 453-454
  17. Lábár JL, Radnóczi and Dobránszky J: "Defect structure of austenic stainless steel studied by electron microscopy", Proc.14th Int. Congr. on Electron Microscopy, Cancun, 1998, Eds: Hector A CalderonBenavictes and Miguel José Yacamán, Insitute of Physics Publisher,Bristol and Phyladelphia, 1998, Vol. II., 193-194
  18. Radi Zs, Barna PB and Lábár JL: "XTEM analysis of the sequentiallyformed amorphous and intermetallic phases in HTSD prepared Al-Pt thin filmsystem", Proc. 14th Int. Congr. on Electron Microscopy, Cancun, 1998, Eds:Hector A Calderon Benavictes and Miguel José Yacamán, Insituteof Physics Publisher, Bristol and Phyladelphia, 1998, Vol. II., 293-294
  19. Lábár JL: "Standardless quantitative analysis", Proc. of EMAS’98,Barcelona, Eds: X. Llovet, C. Merlet and F. Salvat, 1998, Universitat deBarcelona, 153-162 (Invited lecture)
  20. P.B.Barna, M.Adamik, J.L.Lábár: "Formation mechanism of nanocrystallinecomposite structures in codeposited thin films", Proc. Special Symposiumon Advanced Materials, “High Tech Materials -1998 - Spring, Nagoya, Japan,1998, pp. 232-235
  21. Lábár JL, Morgiel J, Tóth L and Dódony I: "Determination of site occupation in garnets by TEM", Proc. X Conf. on Electron Microscopy of Solids, Warsaw-Serock, 1999, ISBN 83-907892-4-8, Eds. Jezierska E. and Kozubowski J.A., 137-140
  22. Kovács A., Lábár J.L. and Barna B.P.: "Intermetallic phase formation in the Al-Pt multilayers by in-situ annealing in a TEM", Proc. IV. Multinational Congress on Electron Microscopy, Veszprém, 1999, Ed. Kovács K., 339-340
  23. Devenyi A., Belu-Marian A., Popescu R., Constantin M, Pantelica D., Barna B.P., Lábár J.L. and Manaila R.: "Interface Interaction in Metal-C60 Nanostructured Thin Films", Proc. EUROMAT 99, Munich, 1999
     

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